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Weekly error Weekly tip Weekly word Weekly poem Column of the month
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When something is first presented, it is “new” information; subsequent references are “old” information. In the passage below, revise the second sentence so that the point presented in the first sentence (the “old” information) appears at the beginning rather than at the end of the second sentence. Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM) are complementary technologies. They can be used to examine the surface of various materials at various magnifications. For a description of Joseph Williams' book, Style: Ten Lessons in Clarity and Grace, visit Recommended Reading and Resources. |
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Weekly error Weekly tip Weekly word Weekly poem Column of the month
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